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Near-Field MIMO-SAR Millimeter-Wave Imaging With Sparsely Sampled Aperture Data.

Muhammet Emin YanikMurat Torlak
Published in: IEEE Access (2019)
Keyphrases
  • image data
  • sparsely sampled
  • high quality
  • millimeter wave
  • image processing
  • multiscale
  • computational complexity
  • denoising
  • experimental data