Endurance prediction and error Reduction in NAND flash using machine learning.
Barry FitzgeraldDamien HoganConor RyanJoe SullivanPublished in: NVMTS (2017)
Keyphrases
- error reduction
- machine learning
- feature selection
- iterative learning
- prediction accuracy
- semi supervised
- significant improvement
- classification accuracy
- machine learning algorithms
- data mining
- pattern recognition
- classification error
- learning algorithm
- text classification
- machine learning methods
- semi supervised learning
- active learning
- model selection
- data analysis
- rough sets
- reinforcement learning
- support vector machine
- flash memory
- learning process
- feature space