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Signature Driven Post-Manufacture Testing and Tuning of RRAM Spiking Neural Networks for Yield Recovery.

Anurup SahaChandramouli N. AmarnathKwondo MaAbhijit Chatterjee
Published in: ASPDAC (2024)
Keyphrases
  • spiking neural networks
  • biologically inspired
  • learning rules
  • neural models
  • biologically plausible
  • feed forward
  • neural network
  • object recognition
  • training algorithm