Early estimation of defect density using an in-process Haskell metrics model.
Mark SherriffNachiappan NagappanLaurie A. WilliamsMladen A. VoukPublished in: A-MOST (2005)
Keyphrases
- computational model
- probabilistic model
- experimental data
- reasoning process
- formal model
- statistical model
- process model
- management system
- theoretical analysis
- petri net
- programming language
- general purpose
- least squares
- conceptual model
- neural network model
- metamodel
- estimation algorithm
- recognition process
- analytical model
- generation process
- high level