Fast classification of small X-ray diffraction datasets using data augmentation and deep neural networks.
Felipe OviedoZekun RenShijing SunCharlie SettensZhe LiuNoor Titan Putri HartonoRamasamy SavithaBrian L. DeCostSiyu I. P. TianGiuseppe RomanoAaron Gilad KusneTonio BuonassisiPublished in: CoRR (2018)