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A Novel Meta-predictor based Algorithm for Testing VLSI Circuits.
Shruti Pandey
Jayadeva
Smruti R. Sarangi
Published in:
CoRR (2022)
Keyphrases
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detection algorithm
learning algorithm
vlsi circuits
optimal solution
k means
computational complexity
neural network
objective function
pattern recognition
preprocessing
worst case
high speed
expectation maximization
segmentation algorithm