Reliability for Recessed Channel Structure n-MOSFET.

J. Y. Seo K. J. Lee Y. S. Kim S. Y. Lee S. J. Hwang C. K. Yoon

Published in: Microelectron. Reliab. (2005)

Keyphrases

information retrieval
database
artificial intelligence
hierarchical structure
structural properties
geometric structure
neural network
multi agent
search algorithm
expert systems
tree structure
structural information