Fast statistical analysis of rare circuit failure events via scaled-sigma sampling for high-dimensional variation space.
Shupeng SunXin LiHongzhou LiuKangsheng LuoBen GuPublished in: ICCAD (2013)
Keyphrases
- statistical analysis
- parameter space
- high dimensional
- low dimensional
- lower dimensional
- dimensionality reduction
- input space
- higher dimensional
- high speed
- rare events
- event detection
- high dimensional spaces
- monte carlo
- similarity search
- search space
- component failures
- embedding space
- sample space
- clinical data
- high dimensional data
- random sampling
- human activities
- shape space
- small sample size
- multi dimensional
- statistical analyses
- feature space
- feature extraction