• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

Bin Ratio-Based Histogram Distances and Their Application to Image Classification.

Weiming HuNianhua XieRuiguang HuHaibin LingQiang ChenShuicheng YanStephen J. Maybank
Published in: IEEE Trans. Pattern Anal. Mach. Intell. (2014)
Keyphrases