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Electromigration of Cu/low dielectric constant interconnects.

Chao-Kun HuL. GignacR. Rosenberg
Published in: Microelectron. Reliab. (2006)
Keyphrases
  • simulation software
  • dielectric constant
  • input output
  • patch antenna
  • multi band
  • microstrip
  • electric field
  • waveguide