Technical Progress Analysis Using a Dynamic Topic Model for Technical Terms to Revise Patent Classification Codes.
Mana IwataYoshiro MatsudaYoshimasa UtsumiYoshitoshi TanakaKazuhide NakataPublished in: CoRR (2020)
Keyphrases
- topic models
- machine learning
- support vector machine
- topic modeling
- data analysis
- probabilistic model
- co occurrence
- probabilistic topic models
- data mining
- latent dirichlet allocation
- conditional random fields
- image classification
- graphical models
- supervised learning
- feature space
- support vector
- artificial intelligence
- learning algorithm