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Adaptive and Stochastic Algorithms for Electrical Impedance Tomography and DC Resistivity Problems with Piecewise Constant Solutions and Many Measurements.
Kees van den Doel
Uri M. Ascher
Published in:
SIAM J. Sci. Comput. (2012)
Keyphrases
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piecewise constant
computational complexity
prior knowledge
level set method
level set
bayesian framework
discrete optimization