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Towards Reliable In-Memory Computing: From Emerging Devices to Post-von-Neumann Architectures.
Hussam Amrouch
Nan Du
Anteneh Gebregiorgis
Said Hamdioui
Ilia Polian
Published in:
VLSI-SoC (2021)
Keyphrases
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von neumann
expected utility
mobile devices
data mining