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Assessing SiCr resistor drift for automotive analog ICs.

Kevin A. StewartKeiichi KimuraMatt RingKoen NoldusPat HulseRick C. JeromeAkihiro HasegawaJeff P. GambinoDavid T. Price
Published in: IRPS (2021)
Keyphrases
  • automotive industry
  • signal processing
  • concept drift
  • data sets
  • neural network
  • decision trees
  • data mining
  • multi agent
  • circuit design
  • driver assistance
  • error accumulation
  • analog vlsi
  • drift detection