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A Two-Parameter Modified Logistic Map and Its Application to Random Bit Generation.
Lazaros Moysis
Aleksandra Tutueva
Christos K. Volos
Denis N. Butusov
Jesús M. Muñoz-Pacheco
Hector E. Nistazakis
Published in:
Symmetry (2020)
Keyphrases
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maximum a posteriori
euler number
logistic regression
input parameters
databases
machine learning
parameter settings
uniformly distributed
neural network
data mining
information systems
mobile devices
parameter tuning