Login / Signup

Dynamic Statistical-Timing-Analysis-Based VLSI Path Delay Test Pattern Generation.

Bao LiuLu Wang
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2015)
Keyphrases
  • statistical analysis
  • dynamic environments
  • dynamically changing
  • search engine
  • signal processing
  • statistical information
  • neural network
  • artificial intelligence
  • power dissipation