A Fault Analysis Method for Synchronous Sequential Circuits.
Tah-Yuan KuoJau-Yien LeeJhing-Fa WangPublished in: DAC (1990)
Keyphrases
- significant improvement
- cost function
- experimental evaluation
- clustering method
- neural network
- high precision
- computational cost
- probabilistic model
- high accuracy
- input data
- statistical analysis
- optimization method
- optimization algorithm
- computationally efficient
- mutual information
- feature set
- support vector machine
- preprocessing
- data analysis