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On predicting NBTI-induced circuit aging by isolating leakage change.

Yinhe HanSong JinJibing QiuQiang XuXiaowei Li
Published in: ISQED (2013)
Keyphrases
  • data mining
  • age related
  • computer vision
  • image processing
  • database systems
  • low cost
  • steady state
  • circuit design