A new scheme for testability improvement of ECC incorporated memory.

Lei Wang Jianhua Jiang Yumei Zhou Gaofeng Ren

Published in: ASICON (2011)

Keyphrases

memory usage
elliptic curve cryptography
elliptic curve
classification scheme
security analysis
database
real time
genetic algorithm
video sequences
image quality
memory requirements
learning scheme
computing power
bloom filter
recognition scheme
garbage collection