The Phase and Amplitude Errors Frequency Dependence in L-Band Aperture Synthesis Radiometer Using External Noise Sources.
Shilin LiJing WuTaoyun ZhouDengzhun WangZhuolin GaoPublished in: ICCCS (4) (2018)
Keyphrases
- frequency response
- phase information
- high pass
- instantaneous frequency
- signal to noise ratio
- low frequency
- external information
- low pass
- high frequency
- frequency modulation
- frequency band
- frequency domain
- residual error
- errors occur
- bandpass
- measurement errors
- shift invariant
- class noise
- information sources
- estimation error
- phase difference
- random noise
- power spectra
- registration errors
- image processing
- transfer function
- palmprint
- wavelet transform
- imaging systems
- frequency spectrum
- image structure
- wavelet domain
- short time fourier transform
- data sources
- high resolution