Spherical-Patches Extraction for Deep-Learning-Based Critical Points Detection in 3D Neuron Microscopy Images.
Weixun ChenMin LiuQi ZhanYinghui TanErik MeijeringMiroslav RadojevicYaonan WangPublished in: IEEE Trans. Medical Imaging (2021)
Keyphrases
- markov random field
- deep learning
- critical points
- microscopy images
- vector field
- scale space
- machine learning
- conditional random fields
- unsupervised learning
- multi channel
- neural network
- object detection
- information extraction
- mental models
- three dimensional
- active contours
- cell division
- natural images
- active learning
- image patches
- image analysis
- automatic extraction
- pattern recognition
- weakly supervised
- similarity measure