Top-Down Attention Control at Feature Space for Robust Pattern Recognition.
Su-In LeeSoo-Young LeePublished in: Biologically Motivated Computer Vision (2000)
Keyphrases
- pattern recognition
- feature space
- neural network
- computer vision
- dimensionality reduction
- feature extraction
- control system
- control method
- robust estimation
- high dimensional
- image processing
- hyperplane
- data points
- image analysis
- data acquisition
- partial occlusion
- pattern recognition problems
- control theory
- robotic systems
- input space
- mean shift
- support vector machine svm
- low dimensional
- classification accuracy
- machine learning