A novel multi-direction high shock reliability test on MEMS devices.

Wenzhong Lou Renlong Song Yunjian Liu Xiaosong Liu Weihua Li Wanfeng Lin

Published in: NEMS (2009)

Keyphrases

wide range
mobile devices
low cost
image processing
low power consumption
data sets
database systems
bayesian networks
evolutionary algorithm
significantly higher
smart phones
high reliability