An Adversarial Active Sampling-Based Data Augmentation Framework for AI-Assisted Lithography Modeling.
Mingjie LiuHaoyu YangBrucek KhailanyHaoxing RenPublished in: ICCAD (2023)
Keyphrases
- data sets
- data collection
- data processing
- synthetic data
- multi agent
- high quality
- image data
- statistical analysis
- computer systems
- data mining techniques
- data analysis
- spatial data
- main contribution
- experimental data
- small number
- knowledge discovery
- data quality
- complex data
- prior knowledge
- raw data
- modeling framework
- heterogeneous sources
- missing data
- high dimensional data
- data warehouse
- case based reasoning
- end users
- probabilistic model
- training data
- machine learning