Analytical charge-control and I-V model for submicrometer anddeep-submicrometer MOSFETs fully comprising quantum mechanical effects.
Yutao MaLitian LiuLilin TianZhiping YuZhijian LiPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2001)
Keyphrases
- statistical model
- similarity measure
- control method
- formal model
- probabilistic model
- computational model
- genetic algorithm
- high level
- mathematical model
- control strategies
- database
- hybrid model
- control strategy
- experimental data
- parameter estimation
- input data
- management system
- control system
- prior knowledge
- multi agent
- multiscale