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Comparative low frequency noise analysis of bipolar and MOS transistors using an advanced complementary BiCMOS technology.

Jeffrey A. BabcockBill LoftinPraful MadhaniXinfen ChenAngelo PintoDieter K. Schroder
Published in: CICC (2001)
Keyphrases
  • low frequency
  • high frequency
  • subband
  • frequency domain
  • wavelet transform
  • wavelet analysis
  • feature selection
  • multiscale
  • image analysis
  • discrete wavelet transform
  • high quality