Towards Big Data Visualization for Monitoring and Diagnostics of High Volume Semiconductor Manufacturing.
Dimitra GkorouAlexander YpmaGeorge TsirogiannisManuel GiolloDag SonntagGeert VinkenRichard van HarenRobert Jan van WijkJelle NijeTom HoogenboomPublished in: Conf. Computing Frontiers (2017)
Keyphrases
- high volume
- big data
- semiconductor manufacturing
- data visualization
- data analysis
- discrete event simulation
- cloud computing
- process control
- data processing
- data management
- real time
- unstructured data
- big data analytics
- vast amounts of data
- production system
- massive data
- business intelligence
- social media
- data science
- knowledge discovery
- expert systems
- predictive modeling
- real world
- data driven decision making
- social computing
- massive datasets
- object oriented
- control system
- machine learning
- databases