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Double cell upsets mitigation through triple modular redundancy.
Yuanqing Li
Anselm Breitenreiter
Marko S. Andjelkovic
Junchao Chen
Milan Babic
Milos Krstic
Published in:
Microelectron. J. (2020)
Keyphrases
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modular neural networks
real time
data mining
risk management
machine learning
bayesian networks
multiple description coding
microscope images
modular architecture
modular structure
immune response
inter cell
redundancy reduction