Signal noise perturbation on automotive mixed-mode semiconductor device generated by graded substrate defect.
Yann WeberLinda BuffoBéatrice VanhuffelNicholas LeeNeal StirlenJeff ChenXiang-Dong WangPublished in: Microelectron. Reliab. (2014)
Keyphrases
- mixed mode
- semiconductor devices
- random noise
- additive noise
- low signal to noise ratio
- received signal
- low frequency
- signal detection
- field effect transistors
- signal processing
- high frequency
- noisy environments
- noise reduction
- signal to noise ratio
- frequency domain
- database systems
- direct sequence spread spectrum
- code generation
- noise model
- noise level
- computer aided
- building blocks
- software development