An Implementation of Scalable High Throughput Data Platform for Logging Semiconductor Testing Results.

ChenKun Tsung Hsiang-Yi Hsieh Chao-Tung Yang

Published in: IEEE Access (2019)

Keyphrases

layered architecture
real time
lightweight
artificial neural networks
implementation issues
computing platform
platform independent
embedded software
data sets
genetic algorithm
implementation details
web scale
semiconductor manufacturing
runtime environment
model based testing
pilot testing