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An Implementation of Scalable High Throughput Data Platform for Logging Semiconductor Testing Results.
ChenKun Tsung
Hsiang-Yi Hsieh
Chao-Tung Yang
Published in:
IEEE Access (2019)
Keyphrases
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layered architecture
real time
lightweight
artificial neural networks
implementation issues
computing platform
platform independent
embedded software
data sets
genetic algorithm
implementation details
web scale
semiconductor manufacturing
runtime environment
model based testing
pilot testing