Login / Signup
Automatic line-shaped defect evaluation of solid-state imaging device.
Toshio Asano
Seiji Hata
Susumu Koishikawa
Youichi Shimizu
Published in:
Systems and Computers in Japan (1990)
Keyphrases
</>
solid state
imaging devices
image sensor
random access
digital camera
flash memory
image analysis
high speed
low power