Weak Die Screening by Feature Prioritized Random Forest for Improving Semiconductor Quality and Reliability.
Shian-Yu LinPai-Yu TanCheng-Wen WuMing-Der ShiehChien-Hui ChuangGordon LiaoPublished in: ITC-Asia (2022)
Keyphrases
- random forest
- feature importance
- feature set
- random forests
- decision trees
- feature selection
- feature vectors
- multi label
- ensemble methods
- feature extraction
- feature ranking
- image features
- data sets
- fold cross validation
- data mining
- ensemble learning
- machine learning
- prediction accuracy
- classification accuracy
- feature space