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Equivalent inverter-based characterization tool for nano-scale CMOS digital cells: Non-linear-delay-models evaluation.
Ioannis Messaris
Maria Ntogramatzi
Nikolaos Karagiorgos
Spyridon Nikolaidis
Published in:
MOCAST (2018)
Keyphrases
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nano scale
statistical models
probabilistic model
neural network
low cost
parameter estimation
evaluation method
real time
data sets
prior knowledge
fuzzy logic
model selection
model validation