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Equivalent inverter-based characterization tool for nano-scale CMOS digital cells: Non-linear-delay-models evaluation.

Ioannis MessarisMaria NtogramatziNikolaos KaragiorgosSpyridon Nikolaidis
Published in: MOCAST (2018)
Keyphrases
  • nano scale
  • statistical models
  • probabilistic model
  • neural network
  • low cost
  • parameter estimation
  • evaluation method
  • real time
  • data sets
  • prior knowledge
  • fuzzy logic
  • model selection
  • model validation