Timed-SDF patterns for applications throughput analysis.

Imed E. BennourAbderrazek Jemai
Published in: IDT (2016)
Keyphrases
  • response time
  • statistical analysis
  • multiscale
  • image analysis
  • pattern discovery
  • database
  • neural network
  • artificial intelligence
  • decision making
  • expert systems
  • software engineering