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Phase displacement study in MOSFET based ring VCOs due to heavy-ion irradiation using 3D-TCAD and circuit simulation.

Maran PonnambalamN. VinodhkumarR. SrinivasanPremanand Venkatesh Chandramani
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • empirical studies
  • experimental study
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  • artificial intelligence
  • multi agent
  • optical flow
  • simulation study
  • numerical simulations