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An integrated tailoring model for thermal cycling tests of spacecraft electronics.
Xin-Yan Ji
Yun-Ze Li
Jing Wang
Xiao-Ning Yang
Yan-Qiang Bi
Zhi-Song Cao
Xi-Yuan Li
Guo-Qing Liu
Published in:
IEEE Trans. Aerosp. Electron. Syst. (2016)
Keyphrases
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formal model
high level
probabilistic model
statistical model
real time
similarity measure
sensitivity analysis
conceptual model
computational model
earth observing
database
autoregressive
management system
probability distribution
prior knowledge
objective function
machine learning
neural network