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Corn emergence uniformity estimation and mapping using UAV imagery and deep learning.
Chin Nee Vong
Lance S. Conway
Aijing Feng
Jianfeng Zhou
Newell R. Kitchen
Kenneth A. Sudduth
Published in:
Comput. Electron. Agric. (2022)
Keyphrases
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deep learning
unsupervised learning
unsupervised feature learning
machine learning
mental models
computer vision
image processing
weakly supervised
restricted boltzmann machine
information retrieval
high resolution
deep architectures
pattern recognition
higher order