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Defect Level Estimation for Pseudorandom Testing Using Stochastic Analysis.

W. B. JonesD. C. HuangS. C. ChangS. R. Das
Published in: VLSI Design (2001)
Keyphrases
  • statistical analysis
  • data mining
  • robust estimation
  • pseudorandom
  • database
  • genetic algorithm
  • website
  • error analysis
  • levels of abstraction