Login / Signup

A Novel Approach to Analyzing Defects: Enhancing Knowledge Graph Embedding Models for Main Electrical Equipment.

Yanyu ChenJianye HuangJian QianLongqiang YiJinhu LiJiangsheng HuangZhihong Zhang
Published in: ICIC (5) (2023)
Keyphrases
  • graph embedding
  • low dimensional
  • pattern recognition
  • data analysis
  • prior knowledge
  • probabilistic model
  • decision trees
  • multiscale
  • relational databases
  • conceptual model