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A Novel Approach to Analyzing Defects: Enhancing Knowledge Graph Embedding Models for Main Electrical Equipment.
Yanyu Chen
Jianye Huang
Jian Qian
Longqiang Yi
Jinhu Li
Jiangsheng Huang
Zhihong Zhang
Published in:
ICIC (5) (2023)
Keyphrases
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graph embedding
low dimensional
pattern recognition
data analysis
prior knowledge
probabilistic model
decision trees
multiscale
relational databases
conceptual model