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A Scheme for Synthesizing Testable VLSI Designs with Minimum Area Overhead.

Biswadip MitraParimal Pal Chaudhuri
Published in: VLSI Design (1993)
Keyphrases
  • database
  • databases
  • vlsi implementation
  • image compression
  • recognition scheme
  • low overhead
  • search engine
  • multiscale
  • classification scheme
  • representation scheme
  • detection scheme
  • vlsi design
  • square error