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Instance-Agnostic and Practical Clean Label Backdoor Attack Method for Deep Learning Based Face Recognition Models.

Tae-Hoon KimSeokHwan ChoiYoon-Ho Choi
Published in: IEEE Access (2023)
Keyphrases
  • deep learning
  • face recognition
  • similarity measure
  • computer vision
  • unsupervised learning
  • segmentation method
  • active learning
  • probabilistic model
  • em algorithm
  • data mining
  • automatic extraction