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QuiltNet: efficient deep learning inference on multi-chip accelerators using model partitioning.

Jongho ParkHyukJun KwonSeowoo KimJunyoung LeeMinho HaEuicheol LimMohsen ImaniYeseong Kim
Published in: DAC (2022)
Keyphrases
  • deep learning
  • probabilistic model
  • data mining
  • feature extraction
  • em algorithm