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FIT: Inspect vulnerabilities in cross-architecture firmware by deep learning and bipartite matching.

Hongliang LiangZhuosi XieYixiu ChenHua NingJianli Wang
Published in: Comput. Secur. (2020)
Keyphrases
  • deep learning
  • bipartite matching
  • unsupervised learning
  • unsupervised feature learning
  • machine learning
  • maximum weight
  • weakly supervised
  • mental models
  • minimum cost flow
  • data mining
  • bayesian networks