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Fast power cycling protocols implemented in an automated test bench dedicated to IGBT module ageing.

François ForestAmgad RashedJean-Jacques HuselsteinThierry MartiréPhilippe Enrici
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • fully automated
  • semi automated
  • neural network
  • computer aided
  • older adults
  • power distribution
  • databases
  • digital libraries
  • semi automatic
  • simulation software