Login / Signup

Clearance vs. tolerance for rigid overconstrained assemblies.

Jean-François RameauPhilippe SerréMireille Moinet
Published in: Comput. Aided Des. (2018)
Keyphrases
  • phase transition
  • three dimensional
  • learning algorithm
  • pattern recognition
  • wide range
  • support vector
  • data analysis
  • image analysis
  • cellular automata
  • articulated motion