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Role of Material Gate Engineering in Improving Gate All Around Junctionless (GAAJL) MOSFET Reliability Against Hot-Carrier Effects.

Hichem FerhatiFayçal DjeffalToufik Bentrcia
Published in: ICM (2020)
Keyphrases
  • field effect transistors
  • multiple input
  • nano scale
  • engineering design
  • systems engineering
  • cmos technology
  • real time
  • data sets
  • case study
  • information technology
  • software engineering
  • liquid crystal displays