An empirical model for static I-V characteristics of double gate tunneling field effect transistor.

D. M. Huang C. J. Yao D. H. Shi M. F. Li

Published in: ASICON (2013)

Keyphrases

mathematical model
neural network
probabilistic model
computational model
theoretical framework
experimental data
database
high level
bayesian networks
multi agent
artificial neural networks
conceptual model
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prediction model
mathematical analysis