Neural network reinforced point defect concentration estimation model for Czochralski-grown silicon crystals.
Mutlu AvciSerhan YamaçliPublished in: Math. Comput. Model. (2010)
Keyphrases
- neural network
- computational model
- probabilistic model
- prediction model
- high level
- prior knowledge
- network model
- neural network model
- experimental data
- estimation process
- mathematical model
- parameter estimation
- maximum likelihood
- management system
- self organizing maps
- theoretical framework
- statistical model
- conceptual model
- input data
- estimation algorithm
- artificial neural networks