HAEM: Obtaining Higher-Quality Classification Task Results with AI Workers.
Yu YamashitaHiroyoshi ItoKei WakabayashiMasaki KobayashiAtsuyuki MorishimaPublished in: WebSci (2022)
Keyphrases
- higher quality
- artificial intelligence
- pattern recognition
- high quality
- machine learning
- reconstructed image
- classification accuracy
- image classification
- perceived quality
- decision trees
- support vector
- information technology
- feature vectors
- support vector machine
- image reconstruction
- feature selection
- data sets
- expert systems
- training set
- multiscale
- face recognition