A New Approach to DC Parameter Measurement in the Day of VLSI.
Takeshi ShigematsuTakashi SakamotoYoshio YamanakaPublished in: ITC (1983)
Keyphrases
- high speed
- signal processing
- parameter values
- input parameters
- vlsi design
- computer vision
- data sets
- parameter tuning
- image compression
- vlsi circuits
- single parameter
- single chip
- optimal parameters
- window size
- high dimensional
- case study
- image processing
- information systems
- artificial intelligence
- information retrieval